A text receiving and recovery system was designed for em information leakage from computers.
设计了针对计算机电磁信息泄漏的接收和再现系统。
The result shows that EM information leakage exists in CMOS integrated circuit during work, XOR operation in each round of DES is an attack point.
分析了CMOS逻辑门电路在运行时的电流特征，阐明了集成电路中数据与电磁辐射的相关性，建立了寄存器级电磁信息泄漏汉明距离模型。
The result shows that EM information leakage exists in CMOS integrated circuit during work, XOR operation in each round of DES is an attack point.
分析了CMOS逻辑门电路在运行时的电流特征，阐明了集成电路中数据与电磁辐射的相关性，建立了寄存器级电磁信息泄漏汉明距离模型。
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