The result shows that EM information leakage exists in CMOS integrated circuit during work, XOR operation in each round of DES is an attack point.
分析了CMOS逻辑门电路在运行时的电流特征，阐明了集成电路中数据与电磁辐射的相关性，建立了寄存器级电磁信息泄漏汉明距离模型。
A text receiving and recovery system was designed for em information leakage from computers.
设计了针对计算机电磁信息泄漏的接收和再现系统。
A text receiving and recovery system was designed for em information leakage from computers.
设计了针对计算机电磁信息泄漏的接收和再现系统。
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