After cleaning the winding end, the leakage current becomes normal.
清除绕组端部污秽后，泄漏电流正常。
Some of these tests include a variety of leakage current measurements.
其中有些测试工作包括各种泄漏电流的测量。
For photoflash lug type miniaturized low leakage current reduces battery consumption.
闪光灯用焊片式缩体产品漏电流小可减少电池消耗。
Leakage current is another source of measurement interference that must be characterized.
漏泄电流是另一种必须表征的测量干扰源。
Leakage current of the capacitors that have been stored for more than 2 years may increase.
贮存超过2年的电容器，其漏电流可能增大。
Leakage current is an error current that flows through insulators when a voltage is applied.
漏泄电流是在施加电压时通过绝缘的误差电流。
It is being studied in the world how to reduce leakage current and to obtain the best detector.
如何把漏电流减少到最低限度，从而获得高质量的探测器，是目前国内外正在研究的重要课题。
The effect of aging voltage on the capacitance and leakage current of al electrolytic capacitors.
老练电压对铝电解电容器容量和漏电流的影响。
The effects of Lanthanum doping on leakage current characteristics were also studied by Shottky model.
研究了镧掺杂对漏电特性的影响，以及肖特基势垒电流模型。
The leakage current will cause overcurrent trip to maintain installation, motor and transformer overheating.
漏泄电流会引发过流维护安装跳闸，使马达和变压器过热。
In other cases, leakage may be expressed as a leakage current at a given voltage, usually the operating voltage.
在另一些情况下，漏电可以用给定电压(通常为工作电压)下的泄漏电流来表示。
To determine the leakage current at a particular voltage, apply a step voltage of this magnitude to the circuit.
为了确定特定电压下的漏流，可以向该电路施加一个该幅值的阶跃电压。
The proposed T-type reset switch avoids the leakage current influence effectively during the integrating period.
所提出的T型复位开关有效避免了积分期间复位开关漏电流的影响。
The generation mechanism of stress induced leakage current (SILC) in flash memory cell is studied by experiments.
通过实验研究了闪速存储器存储单元中应力诱生漏电流(ILC)产生机理。
The improvements are most likely due to the reduction of the gate leakage current and the charge injection effect.
这些效能改进的原因可以归之于经过表面处理后，闸极漏电流的降低以及载子注入的减少。
The two most common error sources when measuring high resistance are electrostatic interference and leakage current.
测量高电阻时两个最常见的误差来源是静电干扰和泄漏电流。
To perform the leakage current test, source a specified reverse voltage, then measure the resulting leakage current.
通过施加规定的反向电压，然后测量产生的漏泄电流，即可完成漏流测试。
This guard connection will prevent leakage current from de-energized channels from interfering with the measurement.
保护连接能防止来自去激励通道的漏流干扰测量。
In other cases, the leakage may be expressed as a leakage current at a given voltage, usually the operating voltage.
在其它情况下，漏泄可能被表示为特定电压(通常为工作电压)下的漏泄电流。
To prevent leakage current on the switch card, take special care when handling to prevent degradation of performance.
为预防开关卡上的漏流，在防止性能劣化时要特别注意。
Once the leakage current in a given pathway is known and remains consistent, it can be subtracted from subsequent measurements.
一旦知道了给定通路的漏流，并保持稳定，即可从随后的测量值中减去该值。
Under both stress conditions stress induced leakage current follows a power law against stress time with different power factors.
在这两种应力条件下，应力导致的漏电流与时间的关系均服从幂函数关系，但是二者的幂指数不同。
The system has been implemented in the laboratory and proved to be a successful-designed tool for insulator leakage current monitoring.
实验室的应用证实，该系统的设计比较成功，是一套研究绝缘子泄漏电流的有效工具。
Although using metal oxide electrodes can solve the fatigue problem, it is not easy to synthesize and the leakage current can increase.
虽然利用金属氧化物电极可以提高其抗疲劳性，但是这种电极不易制备并且会增加漏电流。
Some of these applications may include leakage current of capacitors, reverse diode leakage, or insulation resistance of cables or films.
这类应用可能包括电容器的漏电流、二极管反向漏电、电缆或薄膜的绝缘电阻等。
Since the leakage current through the zener diodes results in a voltage drop across the resistor, low leakage zener devices are desirable.
由于流过齐纳二极管的泄漏电流会在电阻器上产生电压降，所以希望使用低漏电的齐纳二极管。
The SourceMeter instrument first performs the necessary DC tests, such as forward voltage, reverse breakdown voltage, and leakage current.
源表首先进行必要的直流测试，例如正向偏压、反向击穿电压和漏流。
The leakage current can be determined by applying a known voltage and measuring the current between either path to ground or path to path.
通过施加一个已知的电压，然后测量通路至地或通路至通路的电流，即可确定漏泄电流。
As shown in Diagram 1, as from the voltage Uc, the leakage current increases very swiftly and the breakdown voltage is reached for value ue.
正如图1所示，而从电压Uc开始，漏电电流迅速增加，击穿电压达到Ue。
This paper analyzes the reason producing surface leakage current of high resistivity detector, and adopts guard ring to reduce the leakage current.
定性分析了高阻硅探测器表面漏电流的产生，同时介绍了一种有效降低漏电流的方法，即保护环结构。
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