Furthermore, different porous silicon samples were prepared, and whose surface morpho - (logy) analysis and thermal conductivity measurement using micro-raman technology were performed.
此外,采用不同方法制备了多孔硅样品,分析了其表面形貌并用显微拉曼光谱法测定了导热系数。
Furthermore, different porous silicon samples were prepared, and whose surface morpho - (logy) analysis and thermal conductivity measurement using micro-raman technology were performed.
此外,采用不同方法制备了多孔硅样品,分析了其表面形貌并用显微拉曼光谱法测定了导热系数。
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