The piezoresponse force microscopy(PFM) is a useful method to study ferroelectric domains of ferroelectric films.
压电响应力显微镜为铁电薄膜电畴的研究提供了一种有效的检测方法。
The piezoresponse force microscopy(PFM) is a useful method to study ferroelectric domains of ferroelectric films.
铁电薄膜是一类重要的功能材料，铁电畴是其物理基础。
The piezoresponse force microscopy(PFM) is a useful method to study ferroelectric domains of ferroelectric films.
铁电薄膜是一类重要的功能材料，铁电畴是其物理基础。
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