The X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and selected area electron diffraction (SAED) results indicate that the sputtered film has an amorphous structure.
射线衍射(XRD)、高分辨率透射电镜(HRTEM)和选区电子衍射(SAED)分析表明，该薄膜为非晶态。
The selected area electron diffraction (SAED) pattern of the twin was indexed by transforming matrix of hexagon crystal twin plan.
并采用六方晶系孪晶面的变换矩阵对孪晶电子衍射花样进行了标定。
The selected area electron diffraction (SAED) pattern of the twin was indexed by transforming matrix of hexagon crystal twin plan.
并采用六方晶系孪晶面的变换矩阵对孪晶电子衍射花样进行了标定。
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