• This step is called power-on self-test (POST).

    该步骤称为上电自检(power - on self - test, POST)。

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  • If you have problems with the self-test, contact your printer manufacturer.

    如果自测有问题,请与打印机制造商联系。

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  • I recommend you the following self-test method, combined with more accurate.

    我推荐你以下几种自测的方法,结合起来更加准确。

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  • To assess how easily you will learn, go through our Self-Test on Learning English.

    去我们的英语自测评估一下你将如何轻松地学习英语。

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  • Enter the amount of memory that matches what is stated on your printer's self-test.

    输入在打印机自测中查到的内存数量。

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  • The system comprises accelerometer, signal processing circuit and self-test system.

    系统包括传感器、信号处理电路和自检测系统;

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  • Press F1 when your server posts self-test info and prompts you to Press F1 to enter BIOS.

    当服务器输出自检信息并提示您PressF1toenterBIOS 时按 F1 键。

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  • To find out more about managing your anger at work, take our self-test How Good Is your anger Management?

    想要了解更多的办法来管理您职场中愤怒的情绪,请做一份我们为您准备的自测题您的愤怒管理做得如何?

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  • Built-in self-test (BIST) is used as an effective test technique and it can greatly reduce test overheads.

    内建自测试(BIST)作为一种有效的测试技术可以大大地降低测试开销。

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  • The self-test code (the command-line usage) provides a straightforward template for any importing module to follow.

    自测代码(命令行用法)为任一导入模块提供了一个可遵循的简单模板。

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  • You can learn the card reader is normal by operating the card reader self-test button or using the test card to verify.

    可先行操作读卡设备本身之自我测试功能键,检查读卡设备是否正常或使用测试卡测试。

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  • A low power test approach for test or built-in self-test based on arithmetic additive generator is proposed in this paper.

    本文提出了一种基于算术加法生成器的测试或内建自测试的低功耗测试方法。

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  • As long as it is formal reagent manufacturers, and self-test when the operation is correct, it is generally more accurate.

    只要是正规厂家生产的试剂,并且自测时操作方法正确,一般都还是比较准确的。

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  • Reseeding is a built-in self-test (B. IST) testing method, which is used to improve fault coverage of pseudo-random testing.

    重新播种的测试方法是一种内建自测试方法,它可以用来提高伪随机测试矢量的故障覆盖率。

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  • The principle of memory built-in self-test is analyzed in detail and a typical implementation of MBIST is given in the paper.

    文中详细分析了嵌入式存储器内建自测试的实现原理,并给出了存储器内建自测试的一种典型实现。

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  • To improve reliability of Fault Diagnosis Device for Large -scale Mechatronics Equipment, more consummate function of self-test is adding.

    为了提高大型机电设备故障诊断装置诊断结果的可靠性,给诊断装置增加了较完善的自检功能。

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  • Software system was loaded into FLASH of DSP, and after self-test, and then gathered data, communicated, calculated and controlled output of signal.

    软件系统载于DSPFLASH中,自检后,进行数据采集、通信、计算及信号输出。

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  • This is important because the programmer designed the circuit self-test based on an analysis of a good circuit and what might fail within that circuit.

    而且这也是非常重要的,因为程序员设计电路自检基于该电路中的分析——什么是好的电路和什么可能会导致失败。

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  • Self-testing by using the glaucoma self-test tables, could enhance the humans ability to prevent and early diagnose glaucoma, and decrease blind incidence.

    目的:通过自测表的自身检测,提高人群对青光眼的防范能力,早期发现青光眼,降低盲目率。

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  • The results of experiment in oil fields show that it can simulate the signals of downhole instruments and resolve the problem of self-test of ground system.

    油田现场试验表明,它完全可以模拟井下仪器,解决了地面系统的自检问题。

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  • In the end, the boundary scan test technology is introduced as the useful complement to functional self-test method, which can improve the fault isolation rate.

    最后介绍了边缘扫描测试技术,指出边缘扫描测试技术是功能自测试方法的有益补充,能够有效提高测试的故障隔离率。

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  • The system improves the test level and faulty diagnose velocity, can be applied to the self-test and state monitor and the monitor of production in large factory.

    该系统提高了电子装备的测试水平和测试诊断速度,也可用于大型工厂的生产监测。

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  • A self-test scheme, under which all test patterns for adder under test in VLSI are produced by the adder self, is presented based on arithmetic additive generator.

    基于算术加法测试生成,提出了VLSI中加法器的一种自测试方案:加法器产生自身所需的所有测试矢量。

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  • The self-test of intelligent device, signal interface and test flow control, database management, and result display and storage is finished with industry computer.

    工控机完成测试仪自检、信号转接板和测试流程控制、数据库管理、结果显示和存储等。

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  • To reduce the storage volume of the test data during the built-in self-test (BIST), a new BIST technique based on two dimensional compression of test data is presented.

    为压缩内建自测试(BIST)期间所需测试数据存储容量,提出了一种新的基于测试数据两维压缩的BIST方案。

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  • It is important to reduce leakage power to improve battery life in portable systems employing periodic self-test, to increase reliability of test and to reduce test-cost.

    降低测试时的漏电流对于延长需要周期性自测试的便携式系统电池寿命、提高测试的可靠性和降低测试成本都至关重要。

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  • Based on FPGA the equipment with the functions of asynchronous serial data transfer, self-test capability, fuze product test and so on is designed and realized by VHDL program.

    该设备以FPGA为核心,使用VHDL硬件描述语言设计并实现了异步串行通讯、测试设备的自检、引信产品的检测等几大功能。

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  • Based on the research of primary DFT method and the structure characteristic of designed CPU, the article combines the boundary scan and Build-In Self-Test based on BILBO to test.

    本文在对目前主要的可测性设计方法进行研究的基础上,根据所设计CPU的结构特点,采用了边界扫描技术和基于BILBO的内建自测试技术结合的可测性设计方案。

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  • Then, the integrated and embedded self-test circuit was designed based on single chip ADUC812 and nixie tube etc. The self-test software was programmed based on assembly language.

    采用ADUC812单片机、数码管等,设计了集成化、嵌入式的自检测系统硬件电路,并利用汇编语言编程实现了机内自检测软件。

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  • Then, the integrated and embedded self-test circuit was designed based on single chip ADUC812 and nixie tube etc. The self-test software was programmed based on assembly language.

    采用ADUC812单片机、数码管等,设计了集成化、嵌入式的自检测系统硬件电路,并利用汇编语言编程实现了机内自检测软件。

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