The race and hazard in the sequential logic circuit is quite essential and must be considered when designing logic circuit.
时序逻辑电路中的竞争冒险是电路设计中必须考虑到的重要方面。
The principle of using sequential logic circuit and 8031 monolithic computer for realizing continuous pulse duration measure are introduced.
主要介绍了用时序逻辑电路实现连续脉冲宽度测量的工作原理，并讨论了采用8031单片机的实现方案。
This paper presents a multiple fault test simulator for sequential logic circuit. The simulator is implemented in serial-parallel to save memory.
本文给出一个时序逻辑电路的多故障测试模拟程序。
Building the transition relation of sequential logic circuit is one of the key technologies for applying model checking method to verify the sequential logic circuit.
有效地建立和表示时序逻辑电路的状态转移关系是应用模型检查方法验证时序逻辑电路的关键技术之一。
This paper presents an efficient sequential circuit automatic test generation algorithm. The algorithm is based on self - adapting algorithm and USES a seventeen - valued logic model.
本文提出了一种高效的时序电路测试生成算法，该算法是建立在自适应算法的基础上，并使用了十七值逻辑模型。
Two test technologies state stable based technology and automatic test technology are given for the test of logic functions of sequential circuit.
及对时序电路逻辑功能的两种检测技术：基于状态表的测试技术和自动检测技术。
A fluid logic sequential network can be classified as deterministic logic circuit and stochastic logic circuit.
流体逻辑时序线路分为确定型逻辑线路和随机型线路。
The circuit includes a sequential logic drive circuit, a DC bias voltage circuit and a monolithic temperature control circuit for the focal plane array.
其中包括时序逻辑驱动电路、直流偏置电压电路及单芯片焦平面温度控制电路。
The circuit includes a sequential logic drive circuit, a DC bias voltage circuit and a monolithic temperature control circuit for the focal plane array.
其中包括时序逻辑驱动电路、直流偏置电压电路及单芯片焦平面温度控制电路。
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