The vertical differential geometrical factor derived from the disturbed method may be used to evaluate the vertical resolution of the array quantitatively.
由微扰法得到的纵向几何因子，可对该电极系的纵向识别能力进行定量讨论。
The vertical differential geometrical factor derived from the disturbed method may be used to evaluate the vertical resolution of the array quantitatively.
由微扰法得到的纵向几何因子，可对该电极系的纵向识别能力进行定量讨论。
应用推荐