Some of them have been studied by X-ray diffraction technique, and their crystal structures are reported precisely.
近年来，人们对糖类化合物的合成方法、结构表征和生物活性进行了深入而广泛的研究。
The crystallization and microstructure of the glass were investigated using scanning electron microscopy and X-ray diffraction technique.
用扫描电子显微镜和X射线衍射技术分析了微晶玻璃析晶和显微特征。
Crystallographic orientation of electrodeposited zinc in five different electrolytes were studied by means of X-ray diffraction technique.
利用X射线衍射技术，研究了由五种不同电镀槽液所获得的镀锌层中品体的取向。
With the help of X-ray diffraction technique, thermal-induced martensite transformation in 304 austenitic stainless steel was investigated.
借助X射线衍射技术，研究了304奥氏体不锈钢热诱发马氏体相变倾向。
The single crystal of HEDP was obtained through recrystallization method, which was characterized by single crystal X-ray diffraction technique, infrared and NMR spectroscopy.
用重结晶方法得到了羟基乙叉二膦酸的单晶，通过单晶x -射线衍射技术测定了晶体的结构，并用红外光谱和核磁共振波谱对其进行了表征。
It showed that X-ray diffraction technique was a good method for measuring solubility of solid solution, by which the solubility of many inorganic materials could be determined accurately.
结果表明：X射线衍射分析方法是一种测定固溶度的理想方法，这种方法还可以广泛用于无机材料固溶度的准确测定。
Using X-ray diffraction technique, the process of the crystal growth of metal ultrafine particles, which are prepared by sputtering method and deposited on the silica! Substrate, have been researched.
利用X -射线衍射技术对溅射沉积在非晶二氧化硅基底上的金属晶体超微粒的生长特性进行实验研究。
And there is a technique known as X-ray diffraction.
而且有种X光衍射的技术。
By means of technique of X-ray double crystal diffraction, the different cutting damages of silicon slices have been studied.
作者利用双晶X射线衍射技术，研究了不同切割速率下硅晶片的切割损伤。
The cube BN grinding wheel was adopted to grind electric ceramic insulator, and the residual stress of insulators was analysed by the X-ray diffraction (XRD) technique.
采用立方氮化硼砂轮磨削电瓷瓷套表面，用X射线衍射法(XRD)分析了其表面所产生的残余应力。
The microscopic mechanism of irradiation damage of Al film reflector is studied by the slow positron annihilation technique and X-ray diffraction.
用慢正电子湮没等分析技术研究了辐照损伤的微观机制。
The structure of the molecular sieves is studied by means of X-ray diffraction, XPS, EPMA and IR spectrometry, and the unit cell parameters are measured with step scanning technique.
用X射线衍射、X射线光电子能谱、X射线电子探针、红外光谱等方法对分子筛进行了结构研究，并用阶梯扫描方法测得其晶胞参数。
The phase structure, morphology and electrochemical performance were analyzed using X-ray diffraction (XRD), scanning electron microscopy (SEM) and galvanostatic charge-discharge cycling technique.
利用X射线衍射（XRD）、扫描电镜（SEM）和恒电流充放电测试技术测试了制备样品的相结构、微观形貌和电化学性能。
The phase structure, morphology and electrochemical performance were analyzed using X-ray diffraction (XRD), scanning electron microscopy (SEM) and galvanostatic charge-discharge cycling technique.
利用X射线衍射（XRD）、扫描电镜（SEM）和恒电流充放电测试技术测试了制备样品的相结构、微观形貌和电化学性能。
应用推荐