• Some of them have been studied by X-ray diffraction technique, and their crystal structures are reported precisely.

    近年来,人们对糖类化合物的合成方法、结构表征和生物活性进行了深入而广泛的研究。

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  • The crystallization and microstructure of the glass were investigated using scanning electron microscopy and X-ray diffraction technique.

    用扫描电子显微镜和X射线衍射技术分析了微晶玻璃析晶和显微特征。

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  • Crystallographic orientation of electrodeposited zinc in five different electrolytes were studied by means of X-ray diffraction technique.

    利用X射线衍射技术,研究了由五种不同电镀槽液所获得的镀锌层中品体的取向。

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  • With the help of X-ray diffraction technique, thermal-induced martensite transformation in 304 austenitic stainless steel was investigated.

    借助X射线衍射技术,研究了304奥氏体不锈钢热诱发马氏体相变倾向。

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  • The single crystal of HEDP was obtained through recrystallization method, which was characterized by single crystal X-ray diffraction technique, infrared and NMR spectroscopy.

    用重结晶方法得到了羟基乙叉二膦酸的单晶,通过单晶x -射线衍射技术测定了晶体的结构,并用红外光谱和核磁共振波谱对其进行了表征。

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  • It showed that X-ray diffraction technique was a good method for measuring solubility of solid solution, by which the solubility of many inorganic materials could be determined accurately.

    结果表明:X射线衍射分析方法是一种测定固溶度的理想方法,这种方法还可以广泛用于无机材料固溶度的准确测定。

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  • And there is a technique known as X-ray diffraction.

    而且有种X光衍射的技术。

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  • By means of technique of X-ray double crystal diffraction, the different cutting damages of silicon slices have been studied.

    作者利用双晶X射线衍射技术,研究了不同切割速率下硅晶片的切割损伤。

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  • The cube BN grinding wheel was adopted to grind electric ceramic insulator, and the residual stress of insulators was analysed by the X-ray diffraction (XRD) technique.

    采用立方氮化硼砂轮磨削电瓷瓷套表面,用X射线衍射法(XRD)分析了其表面所产生的残余应力。

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  • The microscopic mechanism of irradiation damage of Al film reflector is studied by the slow positron annihilation technique and X-ray diffraction.

    用慢正电子湮没等分析技术研究了辐照损伤的微观机制。

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  • The structure of the molecular sieves is studied by means of X-ray diffraction, XPS, EPMA and IR spectrometry, and the unit cell parameters are measured with step scanning technique.

    用X射线衍射、X射线光电子能谱、X射线电子探针、红外光谱等方法对分子筛进行了结构研究,并用阶梯扫描方法测得其晶胞参数。

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  • The phase structure, morphology and electrochemical performance were analyzed using X-ray diffraction (XRD), scanning electron microscopy (SEM) and galvanostatic charge-discharge cycling technique.

    利用X射线衍射(XRD)、扫描电镜(SEM)和恒电流充放电测试技术测试了制备样品的相结构、微观形貌和电化学性能。

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  • The phase structure, morphology and electrochemical performance were analyzed using X-ray diffraction (XRD), scanning electron microscopy (SEM) and galvanostatic charge-discharge cycling technique.

    利用X射线衍射(XRD)、扫描电镜(SEM)和恒电流充放电测试技术测试了制备样品的相结构、微观形貌和电化学性能。

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