The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
The research and development of X-ray coherent scatter imaging, X-ray diffraction enhanced imaging and X-ray coherent scatter CT imaging are mainly summarized.
重点介绍了X射线相干散射成像技术、X射线衍射增强成像技术和X射线相干散射CT成像技术的研究和进展。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
METHODS The powder X ray diffraction analysis was used by spectrum X ray diffraction analysis. The characteristic marked peaks of talcum was found for identification.
方法应用粉末X射线衍射方法，对取自我国主要滑石产区的药用滑石粉样品进行衍射研究（衍射图谱分析及特征标记峰鉴别）。
From the conception of X ray diffraction of electrons in an atom, the mathematical expression of X ray diffraction for an atom in a crystal cell is given.
从原子中的电子对X光散射的概念出发，对任意一个晶胞内的任意一个原子产生的X光衍射给出了具体的数学描述。
The phases of corrosion products on underground steel tube and their changes with depth of rust layer were analysed using Mossbauer effect, X - ray diffraction and proton X -ray fluorescence analysis.
使用穆斯堡尔效应、x射线衍射分析及质子x射线荧光分析法，分析了地下钢管腐蚀产物的相态及其随锈层深度的变化。
The examples of using X radiography and X ray diffraction methods.
射线照相法及X射线结构分析的应用实例；
The atomization mechanism of europium nitrate on graphite probe surface in graphite furnace was investigated experimentally by X-ray diffraction spectrometry and X-ray photoelectron spectrometry.
用x -射线衍射分析与X -射线光电子能谱分析研究了硝酸铕在石墨炉内石墨探针表面原子化机理。
The structural and magnetic properties of the granular film are studied by atomic force microscope, energy dispersion X-ray spectrum, X-ray diffraction, and alternating gradient magnetometer.
利用原子力显微镜、能量散射X射线谱、X射线衍射和交变梯度磁强计研究了该颗粒膜材料的结构和磁学性质。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
The change of the crystalline structure of UHMWPE fiber was studied by small angle X-ray scattering (SAXS) , wide angle X-ray diffraction ( WAXD) and Raman spectroscopy.
利用小角X光散射（SAXS）、广角X射线衍射（WAXD）及拉曼光谱等测试手段，研究了拉伸过程中UHMWPE纤维的结晶结构变化。
The failure of the powder metallurgy valve seat was analyzed by optical microscopy, scanning electronic microscopy, X-ray energy spectrum and X-ray diffraction.
采用力学、物理性能测试，金相、扫描电镜、能谱和X衍射分析研究了气门座圈产品失效的主要原因。
If they have the X-ray powder diffraction patternsof materials, even if being non-expert on X-ray crystal structure, they can conveniently get the index of diffraction lines and cell parameters.
对于非专业X 射线晶体结构人员，只要得到材料衍射图谱后，能很方便计算点阵常数和衍射线指标化。
In this paper, a method for quantitative determination of spectral distributions of primary radiation from X-ray tubes for diffraction and X-ray fluorescent spectral analysis is presented.
本文提出了衍射或荧光分析用的X射线管原级X射线谱强度分布的定量测定方法。
Diffraction, scattering or absorption experiments on materials using synchrotron X-radiation can provide new and more detailed structural information than using conventional X-ray sources.
使用同步辐射X射线进行材料的散射、衍射和吸收实验要比用一般X射线源的实验能提供新的、更精确、更详细的结构信息。
The samples were characterized by X-ray diffraction (XRD), Scanning electronic microscope (SEM), photoluminescence (PL) and X-ray excited luminescence (XEL) spectra.
分别以X-射线衍射（XRD）、扫描电子显微镜（SEM）、光致发光（PL）光谱及X-射线激发的发光（XEL）光谱对样品进行了表征。
X-ray photoelectron spectroscopy and X-ray diffraction were used to analyze the chemical structure of the DLC films containing ti.
通过X射线光电子能谱及X射线衍射表征了薄膜的化学结构。
Then their structures and composing are analyzed by Fourier transform infrared spectroscopy(FT-IR), X-ray diffraction(X-RD), scanning electron microscopy(SEM).
红外光谱、X-射线衍射、扫描电镜分析其结构与组成，对膜进行降解性、溶涨性和兔眼生物相容性实验研究。
The obtained products were characterized by X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM).
合成产物用粉未衍射（XRD）X-射线光电子能谱（XPS）和扫描电子显微（SEM）表征。
Specific frequency used by inductively coupled plasma emission spectroscopy, X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, cyclic voltammetry methods.
具体采用了电感耦合高频等离子体发射光谱、X射线衍射、拉曼光谱、X射线光电子能谱、循环伏安测试手段。
The prepared product was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscope (TEM) and X-ray photoelectron spectroscopy (XPS).
利用X射线衍射(XRD)、扫描电镜(sem)、透射电镜(tem)和X射线光电子能谱(XPS)对制备的产品进行了表征。
The invention provides an amorphous cefodizime sodium, which is characterized in that an amorphous X-ray diffraction pattern is free from having an X-ray diffraction peak;
本发明提供了一种无定形头孢地嗪钠，该无定形的X-射线衍射图中未出现X-射线衍射峰；
The composition of the particles has been determined by X-ray diffraction (XRD) and energy dispersive X-ray spectroscopy (EDX).
这种颗粒的组成可以由x射线衍射(XRD)和x射线能量谱(EDX)检测。
The prepared powders and the green and sintered hollow-fiber membranes were characterized by thermal analysis, X-ray diffraction, scanning electron microscopy and X-ray energy dispersive spectroscopy.
用热分析、X射线衍射仪、扫描电镜、X射线能谱等技术对制备的粉体、烧结前后的中空纤维膜进行了表征。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
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