X-ray Fluorescence (XRF) Spectrometry is an instrumental analytical technique for the elemental analysis of solids and liquids with minimal treatment.
射线荧光光谱法是一种用于固体和液体具有最小样品处理的元素分析的仪器分析技术。
Measurement of coating thickness in the proof-test of IC packages and metal cases using X-Ray Fluorescence (XRF) spectrometry is described.
介绍了在外壳检验中，应用X射线荧光光谱法（XRF），对外壳的镀涂层厚度进行测试；
Measurement of coating thickness in the proof-test of IC packages and metal cases using X-Ray Fluorescence (XRF) spectrometry is described.
介绍了在外壳检验中，应用X射线荧光光谱法（XRF），对外壳的镀涂层厚度进行测试；
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