Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.

The effects of cooling velocity, the lead content and the gravity on the microstructures of Al Pb alloy were discussed based on the results of optical microscope, SEM and quantitative metallography.

Scaning electronics microscopy (SEM) was applied hereby to surface phase and elements analysis of the powder by precursor method and grain sample by microwave method.