Hot-carrier-induced device degradations are also analyzed by st ress experiments under three typical hot-carrier injection conditions.
2
定向井套管应力随地应力条件的变化规律研究,石油学报,2005。
Effects of Well Trajectory in Directional Hole on Casing Stress under Different In-situ Stress Conditions, Progress in safety science and technology, 2005.
3
由于其特殊的应力条件和地质条件,使其成为地质和力学结构上的簿弱点。
Because of its special stress and geologic condition, the region has become a weak position in geological and mechanical structure.