因此，静电放电测试已经成为对器件可靠性评估的一个重要项目。
Therefore, the test of electrostatic discharge has already been an important item in the evaluation of the MOS device′s reliability.
本发明公开了一种预报集成电路静电放电失效的测试电路及预测方法。
The invention discloses a test circuit for predicting static discharge failure of an integrated circuit and a prediction method thereof.
为更好地研究空气式静电放电，利用新型ESD模拟测试系统研究了固定间隙的空气式静电放电特性。
Using a new electrostatic discharge (ESD) simulation and testing set-up, we investigated the characteristics of air ESD at a fixed gap distance.
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