The studies on the boundary scan based SoC testing technology turn out to be relatively mature.
基于边界扫描的SoC测试技术也有较为成熟的研究。
参考来源 - SoC设计平台片上总线及测试技术研究·2,447,543篇论文数据，部分数据来源于NoteExpress
以上来源于: WordNet
Some problems in logic cluster boundary scan test could not be neglected.
逻辑簇的边界扫描测试存在一些不可忽视的重要问题。
There are some common methods of design for testability, such as boundary scan test and so on.
目前常见的可测试性设计方法主要有改善设计法、结构设计法和边界扫描测试法等几种。
As a kind of new developing BIT technology, Boundary scan technology is widely used in industry.
边界扫描技术作为一种新兴的BIT技术，在工业界内得到了广泛的应用。
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