Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.

原子力显微镜是运用一种微小的探针去“感受”样本表面，能得到高分辨率的影像（约5纳米的分辨率）。

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Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.

原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。

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The utility model can realize high space spatial resolution and low measuring force, is suitable for various materials and can measure in an air environment.

本实用新型可以实现高空间分辨率、低测量力，适合各种材料，并且可以在空气环境中进行测量。

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Chen and Nordhous superimposed a grid on high-resolution, nighttime images of the globe taken by U.S. Air Force satellites.

FORBES: The Case for Keeping the Lights On