The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).
并且分别利用原子力显微镜和傅立叶变换红外光谱对薄膜进行界面形态和微观结构分析。
The composition and microstructure of nanocomposite particles were analyzed by fourier transform infrared spectroscopy, energy dispersive X-ray spectroscopy, and scanning electron microscope.
通过X射线能谱仪、扫描电镜与傅立叶变换红外光谱研究纳米颗粒的组成及其微观结构；
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