Moreover, step-stress life-testing with random stress-change times is studied because it is more useful in practice.

其中，具有随机应力转换时间的步加寿命试验由于其实用性而更具有研究的意义。

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The time-transformation of the cumulative exposure model used to analyze step-stress accelerated life testing simplifies the mathematical mode without sacrificing flexibility for fitting data.

对用于分析步进应力加速寿命试验的累积损伤模型进行时间变换，保留模型对数据拟合的灵活性的同时简化了数学计算。

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This paper presents a method to solve reliability evaluation problem of electronic equipments with high reliability and long life using double crossed step-stress testing in Normal distribution.

首先针对高可靠、长寿命电子装备的可靠性评估问题，提出一种新的试验方法——双应力交叉步阶试验。

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