... X-ray diffraction X 射线衍射 X-ray photoelectron spectroscopy X 射线光电子能谱 X-ray scattering X 射线散射 ...
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... X-ray pattern X射线图案 X-ray photoelectron spectroscopy X射线光电子能谱学 X-ray photograph X射线照相 ...
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x ray photoelectron spectroscopy x 射线光电子能谱学
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
X-ray photoelectron spectroscopy and X-ray diffraction were used to analyze the chemical structure of the DLC films containing ti.
通过X射线光电子能谱及X射线衍射表征了薄膜的化学结构。
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