The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.

运用能谱技术（EDXA）、X 射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。

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Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).

用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。

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The samples were characterized by X-ray diffraction (XRD), Scanning electronic microscope (SEM), photoluminescence (PL) and X-ray excited luminescence (XEL) spectra.

分别以X-射线衍射（XRD）、扫描电子显微镜（SEM）、光致发光（PL）光谱及X-射线激发的发光（XEL）光谱对样品进行了表征。

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