The surfaces of diffraction optical element (DOE) are often deep and discontinuous, which lead to some difficulties for measurement of the 3-d surface topography of DOE.
衍射光学元件(DOE)表面形貌的测量需要解决因表面结构深度较大和表面不连续给测量带来的困难。
The optical concentrator receives light from the light emitting element, via the dichroic filter, and emits the light from an exit surface, which is smaller than the entrance surface.
光学集中器经由二向色滤光片接收来自发光元件的光并且从小于入射表面的出射表面发射光。
A novel method of data processing between the finite element deformation results and the surface distortion of optical element was presented and compared with the traditional method.
提出了一种新的有限元变形结果与光学元件面形畸变之间的数据处理方式，并与传统方式进行了对比。
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