They were characterized by X-ray powder diffraction (XRD), transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM).

产物经x -射线粉末衍射(XRD)、透射电子显微镜(TEM)和高分辨电子显微镜(HRTEM)表征。

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The samples' structures were characterized by using powder-X-ray diffraction (XRD) and the samples' morphologies were observed with SEM and the adiabatic temperature changes were determined directly.

用粉末X射线衍射表征材料的相组成，用扫描电镜(SEM)观测样品形貌，用直接法测量材料的绝热温变。

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They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).

对其进行了透射电镜(tem)、X射线粉末衍射(XRD)，场诱导表面光电压谱表征(FISPS)。

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