Some problems in logic cluster boundary scan test could not be neglected.
逻辑簇的边界扫描测试存在一些不可忽视的重要问题。
In this paper, the theory and architecture of boundary scan test technology is introduced and researched, then its application is given.
研究了目前较常用的边界扫描测试技术的原理、结构，并给出了边界扫描技术的应用。
In the end, the boundary scan test technology is introduced as the useful complement to functional self-test method, which can improve the fault isolation rate.
最后介绍了边缘扫描测试技术，指出边缘扫描测试技术是功能自测试方法的有益补充，能够有效提高测试的故障隔离率。
With the continual improvement of the chip's integration level and complexity of print circuit board, the application of boundary scan test technology becomes wider and wider in testing ICs.
随着芯片集成度和印刷电路板复杂度的不断提高，边界扫描测试技术在芯片故障检测中的应用越来越广泛。
The automatic testing software which is compatible with BSDL files and EDIF files can complete multiple boundary scan test tasks.
兼容于BSDL和EDIF文件格式的自动测试向量生成软件可实现多种扫描测试功能。
This paper Outlines the design of features related to test and then details the Boundary Scan test strategies developed for different MCM.
本文概要论及与测试相关的设计特性，详细讨论了不同MCM的边界扫描测试策略。
On the basis of mixed-signal Boundary scan technology, a scheme of mixed-signal Boundary-scan test system is presented and the hardwares are implemented, including the controller and display unit.
基于混合信号边界扫描技术标准，提出混合信号边界扫描控制器的设计方案并实现了其硬件设计，包括边界扫描控制模块、显示驱动模块等。
On the basis of mixed-signal Boundary scan technology, a scheme of mixed-signal Boundary-scan test system is presented and the hardwares are implemented, including the controller and display unit.
基于混合信号边界扫描技术标准，提出混合信号边界扫描控制器的设计方案并实现了其硬件设计，包括边界扫描控制模块、显示驱动模块等。
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