答:边界扫描测试技术(Boundary Scan Testing,BST),主要用于解决可编程逻辑器件芯片的测试问题。这种测试可在器件正常工作时捕获功能数据。
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Boundary-Scan Test Architecture 边界扫描测试技术
boundary scan test system 边界扫描测试系统
boundary-scan test bst 边缘扫描测试
bst boundary scan test 边界扫描测试
boundary scan test bst 边界扫描测试
JTAG boundary-scan test JTAG边界扫描测试
boundary scan test technology 边界扫描测试技术
boundary-scan test controller 边界扫描测试控制器
boundary-scan test technology 边界扫描测试技术
Some problems in logic cluster boundary scan test could not be neglected.
逻辑簇的边界扫描测试存在一些不可忽视的重要问题。
In this paper, the theory and architecture of boundary scan test technology is introduced and researched, then its application is given.
研究了目前较常用的边界扫描测试技术的原理、结构，并给出了边界扫描技术的应用。
In the end, the boundary scan test technology is introduced as the useful complement to functional self-test method, which can improve the fault isolation rate.
最后介绍了边缘扫描测试技术，指出边缘扫描测试技术是功能自测试方法的有益补充，能够有效提高测试的故障隔离率。
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